Applied Physics Letters · 1990 · 83 citations · 4 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsSemiconductor InterfacesSemiconductor PhysicsSemiconductor SurfacesThin Film Electrical PropertiesForward Bias CharacteristicsInductive BiasJunction CapacitanceNegative Capacitance Field-effect TransistorsSchottky Barrier CharacteristicsSchottky Barrier DiodesSchottky BarriersSeries Resistance
A region of anomalous negative capacitance has been observed with forward bias in Se-Tl Schottky evaporated layer structures. The effect, which is more prevalent in diodes with lower series resistance, is due to an inductive contribution to the impedance that is believed to arise from high-level injection of minority electrons into the bulk selenium.
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Origin of the Excess Capacitance at Intimate Schottky Contacts
J. H. Werner, A. F. J. Levi, R. T. Tung et al. · Physical Review Letters · 1988 · 220 citations