Coherent X‐ray nanodiffraction on single GaAs nanowires

Abstract

Abstract Coherent X‐ray nanodiffraction was applied to investigate single GaAs nanowires. Using the nanofocus hard X‐ray setup at ID13 of the ESRF, the diffraction signal from isolated nanowires was measured. The diffraction patterns were recorded for different rotations of the sample. These diffraction patterns were then combined to yield three‐dimensional information around a Wurzite [101] Bragg peak.