In situ electrochemical impedance spectroscopy/synchrotron radiation grazing incidence X-ray diffraction—A powerful new technique for the characterization of electrochemical surfaces and interfaces

Roland De Marco, Zhong‐Tao Jiang, Jay Martizano, Alex Lowe, Bobby Pejcic, Arie van Riessen

Electrochimica Acta · 2006 · 19 citations · 28 references

Concepts

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