Publication | Closed Access
Tunneling FETs on SOI: Suppression of ambipolar leakage, low-frequency noise behavior, and modeling
124
Citations
26
References
2011
Year
Electrical EngineeringEngineeringTunneling MicroscopyPhysicsElectronic EngineeringBias Temperature InstabilityApplied PhysicsAmbipolar LeakageMicroelectronicsBeyond CmosLow-frequency Noise BehaviorSemiconductor Device
| Year | Citations | |
|---|---|---|
Page 1
Page 1