Nanotechnology · 2001 · 35 citations · 22 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsNanoporous MaterialsSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor NanomaterialsSemiconductor PhysicsSemiconductor SurfacesBreakdown VoltageCurrent DensityElectrical PropertiesNanoparticlesOptoelectronic PropertiesPorous SiliconSemiconductor NanostructuresSilicon
Chemically capped CdS nanoparticles are embedded in porous silicon (PS) by a dip coating method. Atomic force microscopy measurements reveal that the PS surface is covered with CdS nanoparticles forming well-defined rectangular blocks of nearly uniform size (200×200 nm2). Photoelectron spectroscopy and energy dispersive x-ray analysis confirm the presence of CdS in PS. Optical and electrical properties of the heterojunctions so-formed are investigated. Junction characteristics show that the composite so-formed exhibits very high forward current density (145 mA cm-2) and high reverse breakdown voltage (15 V).
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Semiconductor Clusters, Nanocrystals, and Quantum Dots
A. Paul Alivisatos · Science · 1996 · 11.4K citations
H. Gleiter · Progress in Materials Science · 1989 · 3.7K citations · Full text