Publication | Closed Access
Measurement of the complex nonlinear refractive index of single crystal <i>p</i>-toluene sulfonate at 1064 nm
79
Citations
11
References
1994
Year
Optical MaterialsEngineeringNonlinear OpticsLaser ApplicationsOptoelectronic DevicesChemistryOptical CharacterizationOptical PropertiesSingle Crystal PtsOptical SystemsOptical SpectroscopyNanophotonicsPhotonicsPhysicsNon-linear OpticPhotonic MaterialsOptoelectronic MaterialsNonlinear CrystalsPs PulsesNatural SciencesSpectroscopyApplied PhysicsCrystalsLight AbsorptionOptoelectronicsNonlinear Refraction
Z-scan at 1064 nm was used with single, 35 ps pulses to measure the nonlinear refraction and absorption in single crystal PTS (p-toluene sulfonate). Detailed analysis of the Z-scan data based on Δn=n2I+n3I2 and Δα=α2I+α3I2 yielded n2=5(±1)×10−12 cm2/W, α2=100(±20) cm/GW, n3=−5(±1)×10−21 cm4/W2 and α3=−5(±1) cm3/GW.2 The resulting two photon figure of merit T for PTS is marginal for high throughput, all-optical waveguide switching at 1064 nm.
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