Publication | Closed Access
Electronics of the SiO2/HfO2 interface by soft X-ray photoemission spectroscopy
41
Citations
6
References
2004
Year
Ii-vi SemiconductorChemical EngineeringEngineeringOxide ElectronicsApplied PhysicsSemiconductor Device FabricationSilicon On InsulatorSio2/hfo2 Interface
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