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Determination of traces of As, B, Bi, Ga, Ge, P, Pb, Sb, Se, Si and Te in high-purity nickel using inductively coupled plasma-optical emission spectrometry (ICP-OES)

Materials ScienceChemical EngineeringEngineeringAnalytical InstrumentationAtomic Emission SpectroscopyNatural SciencesSpectroscopyMass SpectrometryElemental CharacterizationAnalytical ChemistryHigh-purity NickelPlasma-optical Emission SpectrometryChemistrySpectrochemical AnalysisTrace Element