S. Thangavel

Determination of traces of As, B, Bi, Ga, Ge, P, Pb, Sb, Se, Si and Te in high-purity nickel using inductively coupled plasma-optical emission spectrometry (ICP-OES)

S. Thangavel, K. Dash, S.M. Dhavile et al. · Talanta · 2014 · 41 citations

Materials Science, Chemical Engineering, Engineering +12

Spectrophotometric determination of boron in complex matrices by isothermal distillation of borate ester into curcumin

S. Thangavel, S.M. Dhavile, K. Dash et al. · Analytica Chimica Acta · 2003 · 37 citations

Chemical Engineering, Boron Nitride, Engineering +9

Determination of traces of chloride and fluoride in H2SO4, H3PO4 and H3BO3 by in situ analyte distillation—ion chromatography

S. Thangavel, K. Dash, S.M. Dhavile et al. · Journal of Chromatography A · 2005 · 24 citations

Chemical Engineering, Engineering, Separation Science +6

Determination of trace metallic impurities in high-purity quartz by ion chromatography

K. Dash, Kannan Chandrasekaran, S. Thangavel et al. · Journal of Chromatography A · 2003 · 17 citations

Chemical Engineering, Trace Metallic Impurities, Engineering +9

Development of a certified reference material (CRM) for seven trace elements (Al, Ca, Fe, K, Mg, Na and Ti) in high purity quartz

A. Durga Prasad, S. Thangavel, Lori Rastogi et al. · Microchemical Journal · 2021 · 16 citations

Materials Science, Chemical Engineering, Certified Reference Material +8