HRTEM observation of the Si/SiO2 interface

Si/SiO2 interface roughness: Structural observations and electrical consequences

A. H. Carim, Anjan Bhattacharyya · Applied Physics Letters · 1985 · 74 citations

Engineering, Materials Engineering, Materials Science +17

The structural models of the Si/SiO2 interface

Iwao Ohdomari, H. Akatsu, Yukio Yamakoshi et al. · Journal of Non-Crystalline Solids · 1987 · 62 citations

Engineering, Materials Engineering, Materials Science +14

Valley splitting and related phenomena in si inversion layers

Ando Tsuneya · Surface Science · 1980 · 22 citations

Natural Sciences, Materials Engineering, Materials Science +3

Computer simulation of high-resolution transmission electron microscopy images of Si/SiO2 interfaces

Iwao Ohdomari, Tohru Mihara, Kazuhiko Kai · Journal of Applied Physics · 1986 · 20 citations

Engineering, Materials Engineering, Materials Science +17