A. H. Carim

A reassessment of electron escape depths in silicon and thermally grown silicon dioxide thin films

Michael F. Hochella, A. H. Carim · Surface Science · 1988 · 222 citations

Materials Science, Engineering, Physics +8

Microstructure of Solution‐Processed Lead Zirconate Titanate (PZT) Thin Films

A. H. Carim, Bruce A. Tuttle, D.H. Doughty et al. · Journal of the American Ceramic Society · 1991 · 185 citations

Materials Science, Engineering, Perovskite Solar Cell +14

Synthesis of Titanium Silicon Carbide

Sowmya Arunajatesan, A. H. Carim · Journal of the American Ceramic Society · 1995 · 178 citations

Materials Engineering, Materials Science, Chemical Engineering +13

Microstructural evolution of Pb(Zr, Ti)O₃ thin films prepared by hybrid metallo-organic decomposition

Bruce A. Tuttle, T.J. Headley, Bruce C. Bunker et al. · Journal of materials research/Pratt's guide to venture capital sources · 1992 · 115 citations

Materials Science, Materials Engineering, Chemical Engineering +9

Morphology, structure, and nucleation of out-of-phase boundaries (OPBs) in epitaxial films of layered oxides

M. A. Zurbuchen, Wei Tian, Xiaoqing Pan et al. · Journal of materials research/Pratt's guide to venture capital sources · 2007 · 105 citations

Materials Science, Engineering, Epitaxial Films +10