Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy

Abstract

A new common-path and in-line point-diffraction interferometer for quantitative phase microscopy is proposed. The interferometer is constructed by introducing a grating pair into the point-diffraction interferometer, thus forming a common-path and in-line configuration for object and reference waves. Achromatic phase shifting is implemented by linearly moving one of the two gratings in its grating vector direction. The feasibility of the proposed configuration is demonstrated by theoretical analysis and experiments.