Publication | Closed Access
Raman spectral imaging—A nondestructive, high resolution analysis technique for local stress measurements in silicon
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Citations
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References
2006
Year
Raman Spectral Imaging—aEngineeringPhysicsMicroscopyNatural SciencesSpectroscopySurface-enhanced Raman ScatteringApplied PhysicsImaging SpectroscopyLocal Stress MeasurementsOptical SpectroscopyOptical CharacterizationSpectroscopic Method
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