Track sensitivity and the surface roughness measurements of CR-39 with atomic force microscope - Concepedia

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Track sensitivity and the surface roughness measurements of CR-39 with atomic force microscope

24

Citations

3

References

1999

Year

N. Yasuda, Masaki Yamamoto, K. Amemiya, Hidetoshi Takahashi, A. Kyan, Koichi Ogura

Radiation Measurements

Materials ScienceEngineeringElectron MicroscopyMicrofabricationMicroscopyAtomic Force MicroscopeSurface ScienceApplied PhysicsSurface Roughness MeasurementsScanning Force MicroscopyScanning Probe MicroscopyTrack SensitivityInstrumentationNanotribologyMicrostructure

References

	Year	Citations

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