Orientation‐dependent surface composition of <i>i</i> n situ annealed strontium titanate

Abstract

Abstract The surface composition of polycrystalline niobium‐doped strontium titanate (SrTiO 3 : Nb) is studied using X‐ray photoelectron emission microscopy (XPEEM) for many grain orientations in order to characterise the surface chemistry with high spatial resolution. The surface sensitivity is maximised by the use of soft X‐ray synchrotron radiation (SR). The grain orientation is determined by electron backscattering diffraction (EBSD). Stereographic plots are used to show the correlation between surface composition and orientation for several grains. Predominant surface terminations are assigned to major orientations. Copyright © 2008 John Wiley &amp; Sons, Ltd.