Instrumental developments in total reflection x‐ray fluorescence analysis for K‐lines from oxygen to the rare earth elements

Abstract

Abstract Developments in the instrumentation of total reflection x‐ray fluorescence analysis (TXRF) are presented. Different ways of obtaining optimized primary radiation are discussed, and a new double reflector‐collimator is introduced. To increase the number of detectable elements, special devices for low‐ Z and high‐ Z determinations are presented, in addition to a modular TXRF attachment for versatile applications. Detection limits achieved by various types of excitation conditions are given. TXRF has been shown to be a powerful analytical tool for trace element determinations in various samples.