Concepedia

X-ray phase analysis with depth profiling for thin films

Qiuzi Cong, Deyang Yu, Ling-Yin Weng, F.Q. Zhang

Thin Solid Films · 1992 · 14 citations · 5 references

DOI

Concepts

References

5

Grazing incidence synchrotron x-ray diffraction method for analyzing thin films

G.C. Lim, W. Parrish, C. Ortíz et al. · Journal of materials research/Pratt's guide to venture capital sources · 1987 · 152 citations

, , +14

X-ray diffraction by polycrystalline materials

A. R. Lang · Acta Metallurgica · 1956 · 99 citations

, , +9

Characterization of epitaxial films by grazing-incidence X-ray diffraction

Armin Segmüller · Thin Solid Films · 1987 · 49 citations

, , +13

Structure studies of synthetic diamond thin films by x-ray diffraction

Fangqing Zhang, Zhizhong Song, Jingqi Li et al. · Thin Solid Films · 1991 · 19 citations

, , +10

Primary study of structures of r.f.-sputtered MoS2 films

Qiuzi Cong, Deping Yu, J. Wang et al. · Thin Solid Films · 1992 · 13 citations

, , +14