Characterization of epitaxial films by grazing-incidence X-ray diffraction

A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray Spectrometer

L. G. Schulz · Journal of Applied Physics · 1949 · 825 citations

Natural Sciences, Physics, Optics +15

Ion induced adhesion via interfacial compounds

J. E. E. Baglin, A. G. Schrott, R. D. Thompson et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1987 · 78 citations

Natural Sciences, Materials Engineering, Materials Science +12

Characterization of electron-beam deposited tungsten films on sapphire and silicon

Jun H. Souk, John F. O’Hanlon, J. Angillelo · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1985 · 36 citations

Natural Sciences, Materials Engineering, Materials Science +17

Characterization of Epitaxial Films by X-Ray Diffraction

Armin Segmüller · Advances in X-ray Analysis · 1985 · 35 citations

Natural Sciences, Materials Engineering, Materials Science +17

X-ray crystallographic studies of Pb monolayers on Cu(110) surfaces

S. Brennan, P. H. Fuoss, P. Eisenberger · Physical review. B, Condensed matter · 1986 · 31 citations

Natural Sciences, Materials Science, Physics +15