Review of Scientific Instruments · 2003 · 11 citations · 7 references
EngineeringElectrical EngineeringMaterials ScienceOpticsOptoelectronicsPhotonicsCalibrationOptical InstrumentationOptical InstrumentsOptical MetrologySilicon PhotonicsSpectral CalibrationCalibration Of Optical InstrumentsOptical Absorption LinesSilicon Optical PropertiesSilicon WaveguidesThermo-optic TuningWavelength CalibrationWavelength ScalingWavelength Tuning
A wavelength reference based on a temperature-tunable silicon Fabry–Perot etalon is presented. The device provides a compact and cost-effective solution for calibration of the wavelength scale from 1.3 μm to 1.7 μm. The reference is fully automated, needs a single characterization, and operates without an absolute wavelength reference. The performance of the device was estimated by comparing its fringes against acetylene absorption lines. The wavelength differences measured were found to be less than 1 pm.
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Infrared refractive index of silicon
David F. Edwards, Ellen Ochoa · Applied Optics · 1980 · 190 citations
Natural Sciences, Materials Engineering, Materials Science +11