Contact Potential Measurement of Carbon Nanotube by Kelvin Probe Force Microscopy

Abstract

The contact potential of multiwalled carbon nanotubes (MWCNTs) has been successfully measured by Kelvin probe force microscopy (KFM) using a CNT tip as a potential probe. Spatial resolution was improved using a CNT tip compared with the case of using a conventional Au-coated Si tip. The contact potential along the MWCNT placed on the source and drain electrodes with bias voltage was also measured. The potential drop was observed along the MWCNT indicating that the present MWCNTs are diffusive conductors.