Publication | Closed Access
Resonant Inelastic X-Ray Scattering in Hexagonal Boron Nitride Observed by Soft-X-Ray Fluorescence Spectroscopy
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Citations
17
References
1996
Year
X-ray SpectroscopyEngineeringHexagonal BoronB K EdgeElectronic Excited StateSynchrotron Radiation SourceBoron NitrideHexagonal Boron NitrideOptical PropertiesMaterials SciencePhotoluminescencePhysicsQuantum ChemistryExcitation EnergySynchrotron RadiationCrystallographyExcited State PropertyNatural SciencesSpectroscopyX-ray DiffractionApplied PhysicsCondensed Matter PhysicsHund’s CouplingOptoelectronicsSoft-x-ray Fluorescence Spectroscopy
Photon-excited B K fluorescence spectra were measured for hexagonal boron nitride using tunable synchrotron radiation below and above the B K edge. We report Raman-like resonant inelastic scattering of soft x rays involving excitation of delocalized valence-band electrons. The inelastic scattering features track with the excitation energy below threshold, go through a resonance as the excitation is tuned to the B(1s) core-exciton energy, and evolve into incoherent fluorescence as the excitation is raised further. The energy loss is identified as equivalent to an electronic transition of valence $\ensuremath{\sigma}$ electrons to ${\ensuremath{\pi}}^{*}$ conduction-band states.
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