Simulation of atomic force microscope tip–sample/sample–tip reconstruction

Abstract

The image obtained with the atomic force microscope is a convolution of the tip and sample. A numerical algorithm which has been previously reported enables the removal of the tip geometry, hence exposing a more accurate picture of the sample. The efficacy of such a scheme is explored with the use of simulations of the tip–sample interaction using simple geometric considerations. Two examples that illustrate the limitations of image analysis by such procedures are presented.