Journal of Applied Physics · 1996 · 26 citations · 11 references
Natural SciencesMaterials EngineeringMaterials ScienceCondensed Matter PhysicsElectronic MaterialsSemiconductor MaterialsElectronic Band StructureOptical Properties Of SolidsSemiconductor Crystal GrowthHall EffectHall Effect MeasurementsIonizationIonization EnergyMolecular Beam EpitaxyPhotoluminescencePhotoluminescence SpectroscopyZinc Telluride
The binding energy of the nitrogen acceptor in zinc telluride is measured. The zinc telluride samples were grown by molecular beam epitaxy using a plasma source for nitrogen doping. The acceptor ionization energy at infinite dilution limit is deduced from Hall effect analysis to be 53.2±1.5 meV. This value agrees with that of the acceptor ground state energy obtained from photoluminescence spectra, 53.6±0.7 meV. The acceptor energy in strain-free material may be slightly higher due to some residual tensile strain in the samples.
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Acceptor states in CdTe and comparison with ZnTe. General trends
E. Molva, J.L. Pautrat, K. Saminadayar et al. · Physical review. B, Condensed matter · 1984 · 222 citations