A Phased Array RFIC With Built-In Self-Test Capabilities

Abstract

An X-Band phased-array RF integrated circuit with built-in self-test (BIST) capabilities is presented. The BIST is accomplished using a miniature capacitive coupler at the input of each channel and an on-chip I/Q vector receiver. Systematic effects introduced with BIST system are covered in detail and are calibrated out of measurements. The BIST can be done at a rate of 1 MHz with 55 dB signal-to-noise-ratio and allows for the measurement of an on-chip array factor. Measurements done with BIST system agree well with S-parameter data over all test conditions. To our knowledge, this is the first implementation of an on-chip BIST with high accuracy.