Publication | Closed Access
Point defects, diffusion processes, and swirl defect formation in silicon
450
Citations
80
References
1985
Year
Materials SciencePoint DefectsEngineeringPhysicsSurface ScienceCondensed Matter PhysicsApplied PhysicsDefect FormationSemiconductor Device FabricationSilicon On InsulatorDefect ToleranceSilicon Debugging
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