Concepedia

Principal component analysis of TOF-SIMS spectra, images and depth profiles: an industrial perspective

Michaeleen L. Pacholski

Applied Surface Science · 2004 · 31 citations · 4 references

DOI

Concepts

References

4

Principal Component Analysis of TOF-SIMS Images of Organic Monolayers

Mark C. Biesinger, Pierre-Yves Paepegaey, N. S. McIntyre et al. · Analytical Chemistry · 2002 · 102 citations

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Interpretation of Static Time-of-Flight Secondary Ion Mass Spectra of Adsorbed Protein Films by Multivariate Pattern Recognition

Matthew S. Wagner, Bonnie J. Tyler, David G. Castner · Analytical Chemistry · 2002 · 98 citations

, , +14

Multivariate Analysis of TOF-SIMS Spectra from Dodecanethiol SAM Assembly on Gold:  Spectral Interpretation and TOF-SIMS Fragmentation Processes

Daniel J. Graham, Buddy D. Ratner · Langmuir · 2002 · 72 citations

, , +17

Characterization of sequentially grafted polysaccharide coatings using time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) and principal component analysis (PCA)

Sally L. McArthur, Matthew S. Wagner, Patrick G. Hartley et al. · Surface and Interface Analysis · 2002 · 23 citations · Full text

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