Applied Physics Letters · 1996 · 33 citations · 0 references
Natural SciencesMaterials EngineeringMaterials ScienceCeramic MaterialsElectronic MaterialsMetallic MaterialsElectrical Properties Of CeramicsElectrode MaterialsFerroelectric CeramicsFerroelectric MaterialsPiezoelectric CeramicsPiezoelectric MaterialsBarium Titanate CeramicsFerroelectric PropertiesFerroelectric Single CrystalsFerroelectric Thin FilmsLaser AblationPolarization-voltage Hysteresis MeasurementThin Film FerroelectricsThin Oxide Films
Epitaxial near-stoichiometric ferroelectric Pb(Zr0.53Ti0.47)O3 thin films were fabricated on epitaxial metallic LaNiO3 electrodes deposited on (001) SrTiO3 and (001) LaAlO3 single crystal substrates by pulsed laser ablation. The P–E hysteresis loop of PZT in the trilayer of Ag/PZT/LNO/STO was measured using the Sawyer–Tower circuit. The remnant polarization Pr and coercive field Ec at room temperature were 30 μC/cm2 and 69.3 kV/cm (peak-to-peak voltage=30 V, 50 Hz), respectively.