Modeling the sensitivity of CMOS circuits to radiation induced single event transients - Concepedia

Concepedia

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Modeling the sensitivity of CMOS circuits to radiation induced single event transients

37

Citations

14

References

2007

Year

Gilson Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Lima Kastensmidt

Microelectronics Reliability

Electrical EngineeringEngineeringCircuit SystemBias Temperature InstabilityComputer EngineeringCmos CircuitsCosmic RayCircuit SimulationCircuit ReliabilityMicroelectronicsElectromagnetic Compatibility

References

	Year	Citations

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