Concepedia

Reverse currents of Schottky gates of III–V MESFET/HEMTs: field emission and tunnel currents

S. Takamiya, Masaya Harayama, Tomoyuki Sugimura, Tatsutoshi Tsuzuku, Takanobu Taya, Kouichi Iiyama, Shoushin Hashimoto

Solid-State Electronics · 1998 · 20 citations · 2 references

DOI

Concepts

References

2

Off-state breakdown in InAlAs/InGaAs MODFET's

S.R. Bahl, Jesús A. del Alamo, Jürgen Dickmann et al. · IEEE Transactions on Electron Devices · 1995 · 82 citations

, , +14

Source-drain burnout mechanism of GaAs power MESFETS: Three terminal effects

S. Takamiya, T. Sonoda, M. Yamanouchi et al. · Solid-State Electronics · 1997 · 10 citations

, , +7