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Surface track formation on mica surfaces due to grazing incidence 20.2 MeV C60 ions: a comparative study employing shadow-replica electron microscopy, tapping-mode and phase-imaging scanning force microscopy

Mev C60 IonsEngineeringPhysicsMicrofabricationMicroscopyScanning Probe MicroscopySurface ScienceApplied PhysicsScanning Force MicroscopyIon BeamSurface Track FormationIon EmissionMedicineBiophysicsShadow-replica Electron Microscopy