Einstein–de Haas effect in a NiFe film deposited on a microcantilever

Abstract

A method is presented for determining the magnetomechanical ratio g′ in a thin ferromagnetic film deposited on a microcantilever via measurement of the Einstein–de Haas effect. An alternating magnetic field applied in the plane of the cantilever and perpendicular to its length induces bending oscillations of the cantilever that are measured with a fiber optic interferometer. Measurement of g′ provides complementary information about the g factor in ferromagnetic films that is not directly available from other characterization techniques. For a 50nm Ni80Fe20 film deposited on a silicon nitride cantilever, g′ is measured to be 1.83±0.10.