Concepedia

Publication | Open Access

Science-based MEMS reliability methodology

DOIFull Paper Access

30

Citations

13

References

2007

Year

Danelle M. Tanner, Ted B. Parson, Alex D. Corwin, Jeremy A. Walraven, Jonathan W. Wittwer, Brad Boyce, Stephen R. Winzer
Microelectronics Reliability

References

YearCitations

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