Applied Physics Letters · 1986 · 58 citations · 12 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsElectronic MaterialsSemiconductor MaterialsDefects In Electronic MaterialsDislocations In SemiconductorsSemiconductor Crystal GrowthSemiconductor HeterostructuresStrain EngineeringX-ray DiffractionDislocation BehaviorFilteringSuperlattice GrowthSuperlattice MaterialsSuperlatticesThreading DislocationsX-ray Diffraction AnalysisX-ray Diffraction Strain Analysis
We investigate the ability of semiconductor superlattices to filter or block threading dislocations by growing and studying structural properties of superlattices composed of alternating layers (∼100 Å each) of InxGa1−xAs and InyAl1−yAs. These superlattices were grown with x=y corresponding to lattice-matched compositions such that the layers have minimal strain, and x≠y corresponding to lattice-mismatched compositions such that the layers have large coherent strains. By correlating the number of dislocations observed in optical images of the superlattices, with the amount of layer strain determined by x-ray double diffraction analysis, we investigate the effect of strain on the filtering ability. We find that both types of superlattices are effective in filtering dislocations.
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Defects in epitaxial multilayers
J. W. Matthews, A. E. Blakeslee · Journal of Crystal Growth · 1976 · 594 citations
Defects in epitaxial multilayers
J. W. Matthews, A. E. Blakeslee · Journal of Crystal Growth · 1975 · 534 citations
X-ray rocking curve analysis of superlattices
V. S. Speriosu, T. Vreeland · Journal of Applied Physics · 1984 · 269 citations
Dislocation reduction in epitaxial GaAs on Si(100)
R. Fischer, D. Neuman, H. Zabel et al. · Applied Physics Letters · 1986 · 198 citations