Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2009 · 22 citations · 8 references
EngineeringElectrical EngineeringOptoelectronicsPhotonicsSemiconductor DevicesDevice CharacterizationDevice ScalingLaser DiodesLaser PhysicsLaser TrappingSemiconductor LasersExternal Cavity Laser DiodesHigh-power Laser DiodesHigh-power Semiconductor LasersQuantum Well Laser DiodesSemiconductor Laser Diodes
Record values for the rollover power and rollover linear power densities of 9xx nm devices, obtained by simultaneous scaling of length and d/Γ, are reported. The values for d/Γ lay in the range 0.8 μm to 1.2 μm with corresponding cavity lengths from 3.5 mm to 5 mm. The transversal structures were asymmetric, with a higher refractive index on the n side. An optical trap was helpful in reducing the radiation extension on the p side and the overall thickness. The highest rollover linear power densities were 244 mW/μm for structures without an optical trap and 290 mW/μm for those that included an optical trap
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Thermodynamics of facet damage in cleaved AlGaAs lasers
A. Moser · Applied Physics Letters · 1991 · 35 citations