Electron energy loss spectrometry: Mean free paths for some characteristic X-ray excitations

Abstract

A magnetic spectrometer has been used to measure the energy loss spectra of electrons transmitted through thin films in a modified electron microscope. Measurements of the peaks corresponding to characteristic X-ray excitations, after background correction, yield values for the mean free paths of the respective processes. Values are reported for carbon and aluminium K., chromium, iron and copper L-, and silver M-excitation