Journal of Applied Physics · 1992 · 11 citations · 11 references
Natural SciencesMaterials SciencePhysicsAcousticsElectronic MaterialsOpticsAcoustic MeasurementAcoustic Wave PropagationPhysical AcousticsWave Propagation In StructuresX-ray DiffractionX-ray OpticsAcoustic Characterization Of MaterialsAcoustic Field MappingAcoustic Material CharacterizationAcoustic PropertiesDynamical Diffraction TheoryX-ray Diffraction Analysis
A new approach for probing acoustic field in acousto-optical devices based on dynamical x-ray diffraction is demonstrated. The measurements were carried out on the ZnO-SiO2-Si system. The experimental results as well as the advantages of the method are discussed.
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