Publication | Closed Access
Enhancement of the third-order optical nonlinearity in ZnO/Al2O3 nanolaminates fabricated by atomic layer deposition
38
Citations
26
References
2013
Year
Optical MaterialsEngineeringNonlinear OpticsOptoelectronic DevicesThin Film Process TechnologyOptical PropertiesZno/al2o3 NanolaminatesAtomic Layer DepositionNanophotonicsThin Film ProcessingMaterials SciencePhysicsOxide ElectronicsNon-linear OpticPhotonic MaterialsGallium OxideNonlinear CrystalsOptical CeramicThird-order Optical NonlinearityElectro-optics DeviceApplied PhysicsThin FilmsOptoelectronicsNanoscale EngineeringZno Reference Film
We investigate the third-order optical nonlinearity in ZnO/Al2O3 nanolaminates fabricated by atomic layer deposition and show that the third-order optical nonlinearity can be enhanced by nanoscale engineering of the thin film structure. The grain size of the polycrystalline ZnO film is controlled by varying the thickness of the ZnO layers in the nanolaminate in which thin (∼2 nm) amorphous Al2O3 layers work as stopping layers for ZnO crystal growth. Nanoscale engineering enables us to achieve a third harmonic generated signal enhancement of ∼13 times from the optimized nanolaminate structure compared to a ZnO reference film of comparable thickness.
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