Concepedia

Publication | Closed Access

Multi-bit Sigma-Delta TDC Architecture with Improved Linearity

DOI

17

Citations

6

References

2013

Year

Satoshi Uemori, Masamichi Ishii, Haruo Kobayashi, Daiki Hirabayashi, Yuta Arakawa, Yuta Doi, Osamu Kobayashi, Tatsuji Matsuura, Kiichi Niitsu, Yuji Yano,
Journal of Electronic Testing

References

YearCitations

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