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The use of M2 meter to correct for high-power laser aberrations
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2005
Year
EngineeringMeasurementOptical TestingLaser ApplicationsEducationM2 MeterHigh-power LasersOptical PropertiesCalibrationLaser-based SensorInstrumentationBimorph CorrectorOptical CommunicationOptical SystemsPhotonicsAdaptive OpticHigh-power Laser AberrationsPhase ConjugateGeometrical AberrationOptoelectronicsDiffractive Optic
We discuss the new type of the closed loop adaptive optical system with bimorph corrector and M2 meter. The study of some multi-dither algorithms to be used in the system is presented. Multi-dither approach is applied to 40-TW TiS fs laser in JAERI, Japan, to improve the focusability of laser beam. We demonstrate that it is possible to obtain 75% of input power in first diffraction maximum with use both phase conjugate and multi-dither adaptive optical systems.