X-Ray Interferometric Solution of the Surface Registration Problem

Abstract

A Bonse-Hart x-ray interferometer was used to determine the (220) Fourier component of the distribution function of a chemisorbed submonolayer of bromine on a (111) silicon surface. This measurement demonstrates not only the presence of an x-ray interference field above the crystal surface of the analyzer of a Laue-case interferometer, but when coupled with Bragg-case standing-wave measurements also provides the means to determine uniquely the position of surface atoms relative to the bulk lattice.