Journal of Alloys and Compounds · 2009 · 179 citations · 37 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationOptical MaterialsThin FilmsOptical Thin FilmsSemiconductor Thin FilmsThin Film Optical PropertiesThin-film DepositionThin-film MaterialsFilm MorphologyFilm ThicknessFilm Thickness ControlMicrostructureOptical ConstantsThickness-dependent Optical PropertiesThin-film MorphologyThin-film Optical Characterization
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X-ray line broadening from filed aluminium and wolfram
G.K. Williamson, W H Hall · Acta Metallurgica · 1953 · 10.2K citations
Optical Processes in Semiconductors
J. I. Pánkové, D. A. Kiewit · Journal of The Electrochemical Society · 1972 · 4.6K citations
Optical Properties of Semiconductors
H. R. Philipp, Hannelore Ehrenreich · Physical Review · 1963 · 2.1K citations