Tin Whisker Growth Induced by High Electron Current Density - Concepedia

Concepedia

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Tin Whisker Growth Induced by High Electron Current Density

29

Citations

9

References

2007

Year

Yan‐Cheng Lin, Yi‐Shao Lai, Y. L. Lin, Chun-Te Tu, C. R. Kao

Journal of Electronic Materials

EngineeringPhysicsApplied PhysicsCondensed Matter PhysicsCharge Carrier Transport

References

	Year	Citations

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