Concepedia

Publication | Closed Access

Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors

DOI

19

Citations

17

References

2004

Year

N. A. Hastas, Nikolaos Archontas, C.A. Dimitriadis, G. Kamarinos, Th.N. Nikolaidis, N. Georgoulas, A. Thanailakis
Microelectronics Reliability

References

YearCitations

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