Optical system for a multiple-beam scanning electron microscope

Abstract

A novel optical system for a multiple-beam scanning electron microscope (SEM) is proposed. In the case of multiple-beam SEM, multiple secondary-electron beams passing through the column are inherently blurred because of the large energy spread and broad angular distribution of secondary electrons. To avoid cross-talk between the multiple secondary-electron beams, the optical system is designed such that it is divided into two independent parts: one for primary-beam illumination and one for secondary-electron detection. As the key components for the secondary-electron detection, a scan-cancelling deflector, and accelerating electric field were applied. To demonstrate the proposed optical system, a prototype column with four beams was developed. This column enables four SEM images to be separately but simultaneously acquired with more than 99% of the generated secondary electrons. This result demonstrates that high-speed imaging with the proposed multiple-beam SEM is possible in the near future.