The use of the PeakForce^TMquantitative nanomechanical mapping AFM-based method for high-resolution Young's modulus measurement of polymers

Abstract

PeakForceTM quantitative nanomechanical mapping (QNMTM) is a new atomic force microscopy technique for measuring Young's modulus of materials with high spatial resolution and surface sensitivity by probing at the nanoscale. In this work, modulus results from PeakForce™ QNM™ using three different probes are presented for a number of different polymers with a range of Young's moduli that were measured independently by instrumented (nano) indentation testing (IIT). The results from the diamond and silicon AFM probes were consistent and in reasonable agreement with IIT values for the majority of samples. It is concluded that the technique is complementary to IIT; calibration requirements and potential improvements to the technique are discussed.