Fringe scanning scatter plate interferometer using a polarized light

Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses

John H. Bruning, D. R. Herriott, Joseph Gallagher et al. · Applied Optics · 1974 · 1.4K citations

Natural Sciences, Electrical Engineering, Physics +17

Scatter Fringes of Equal Thickness

J.M. Burch · Nature · 1953 · 75 citations

Natural Sciences, Materials Science, Metrology +10

Pacific Conference on Chemistry and Spectroscopy, San Francisco, 6–8 November 1968

J. F. Scott · Applied Optics · 1969 · 28 citations

Natural Sciences, Chemistry, Analytical Chemistry +4