Photoelectrical measurements of the local value of the contact potential difference in the metal–insulator semiconductor (MIS) structures - Concepedia

Concepedia

Publication | Closed Access

Photoelectrical measurements of the local value of the contact potential difference in the metal–insulator semiconductor (MIS) structures

18

Citations

5

References

2004

Year

H. M. Przewłocki, L. Borowicz, D. Brzezińska, W. Rzodkiewicz

Thin Solid Films

SemiconductorsElectrical EngineeringEngineeringPhysicsMetal–insulator SemiconductorApplied PhysicsContact Potential DifferenceSemiconductor MaterialPhotoelectric MeasurementOptoelectronic DevicesCharge Carrier TransportOptoelectronicsElectrical PropertyLocal Value

References

	Year	Citations

Page 1

Page 1