Japanese Journal of Applied Physics · 2007 · 11 citations · 9 references
Natural SciencesMaterials EngineeringMaterials ScienceInorganic ChemistryMaterials ChemistryThin FilmsCrystallization ProcessesInorganic MaterialsInorganic SpectroscopyNanoporous MaterialsSurface PhysicsConcentrationDielectric ConstantDielectric Constant MeasurementMesoporosity EngineeringPorous SilicaSilica-based MaterialsSilicate ChemistryZeolites
The dependence of the electrical characteristics of hydrothermally crystallized pure-silica–zeolite films on the water concentration in the precursor was investigated. Zeolite was crystallized in a silica–zeolite composite film after spin-coating the precursor, which was composed of tetraethylorthosilicate, tetrabutylammonium hydroxide, ethylalcohol, and deionized (DI) water, followed by calcinations at 400 °C. The results of Fourier-transform infrared (FT-IR) spectroscopy indicated that the number of Si–OH and O–H bonds decreased with an increase in the water concentration in the precursor. The dielectric constant of the film decreased with an increase in water concentration, while the leakage current increased.
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Silicalite, a new hydrophobic crystalline silica molecular sieve
Edith M. Flanigen, J. M. Bennett, Robert W. Grose et al. · Nature · 1978 · 1.2K citations
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Pure-Silica Zeolite Low-k Dielectric Thin Films
Zhong Lin Wang, Huanting Wang, Aritra Mitra et al. · Advanced Materials · 2001 · 269 citations
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