Measurement of thin film thickness by electronic speckle pattern interferometry

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

Mitsuo Takeda, Hideki Ina, Seiji Kobayashi · Journal of the Optical Society of America · 1982 · 4.2K citations

Engineering, Interferometry, Digital Holography +16

Shape measurement of small objects using LCD fringe projection with phase shifting

Chenggen Quan, Xin He, Cundeng Wang et al. · Optics Communications · 2001 · 127 citations

Geometric Modeling, Phase Retrieval, Engineering +12

Fourier-transform method of phase-shift determination

Kenneth A. Goldberg, Jeffrey Bokor · Applied Optics · 2001 · 126 citations

Radar, Phase-shifting Interferometry, Engineering +14

Contouring of artwork surface by fringe projection and FFT analysis

Giuseppe Schirripa Spagnolo, G. Guattari, Carmine Sapia et al. · Optics and Lasers in Engineering · 2000 · 52 citations

Geometric Modeling, Art History, Natural Sciences +9

Contour measurement by fibre optic fringe projection and Fourier transform analysis

Chenggen Quan, C.J. Tay, H.M. Shang et al. · Optics Communications · 1995 · 47 citations

Engineering, Coherent Gradient Sensing, Ophthalmology +10