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Electron emission from ion-bombarded aluminum
77
Citations
8
References
1981
Year
Materials ScienceIon ImplantationSecondary-electron YieldEngineeringPhysicsElectron SpectroscopyApplied PhysicsElectron EmissionAtomic PhysicsIon Beam InstrumentationIon BeamIon EmissionIon Energy
The secondary-electron yield from polycrystalline aluminum induced by protons, noble-gas ions, and aluminum ions has been measured as a function of ion energy in the range of 10 to 350 keV and as a function of angle of ion incidence in the interval of 0 ° to 70 °. The experimental data are compared with a theory of electron emission from solids proposed in our previous works. The agreement is good providing additional support for the theory.
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